1. Sub-terahertz testing of millimeter wave Monolithic and very large scale integrated circuits. (May 2019) Authors: Shur, M.; Rudin, S.; Rupper, G.; Reed, M.; Suarez, J. Journal: Solid-state electronics Issue: Volume 155(2019) Page Start: 44 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗