Author/Creator: Ruffilli, R. / Journal: Microelectronics and reliability - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Author/Creator Ruffilli, R. Journal Microelectronics and reliability

1. In-depth investigation of metallization aging in power MOSFETs. Issue 9 (August 2015)

Authors:: Ruffilli, R.; Berkani, M.; Dupuy, P.; Lefebvre, S.; Weber, Y.; Legros, M.
Journal:: Microelectronics and reliability
Issue:: Volume 55:Issue 9/10(2015)
Page Start:: 1966
Record Type:: Journal Article
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2. Mechanisms of power module source metal degradation during electro-thermal aging. (September 2017)

Authors:: Ruffilli, R.; Berkani, M.; Dupuy, P.; Lefebvre, S.; Weber, Y.; Legros, M.
Journal:: Microelectronics and reliability
Issue:: Volume 76/77(2017)
Page Start:: 507
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗