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Author/Creator Ronchi, Nicolo

1. Analysis of slow de-trapping phenomena after a positive gate bias on AlGaN/GaN MIS-HEMTs with in-situ Si3N4/Al2O3 bilayer gate dielectrics. (January 2015)

Authors:
Wu, Tian-Li; Marcon, Denis; Ronchi, Nicolo; Bakeroot, Benoit; You, Shuzhen; Stoffels, Steve; Van Hove, Marleen; Bisi, Davide; Meneghini, Matteo; Groeseneken, Guido; Decoutere, Stefaan
Journal:
Solid-state electronics
Issue:
Volume 103(2015)
Page Start:
127
Record Type:
Journal Article
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Available online (eLD content is only available in our Reading Rooms) ↗

2. Ferroelectric La‐Doped ZrO2/HfxZr1−xO2 Bilayer Stacks with Enhanced Endurance. Issue 5 (26th February 2021)

Authors:
Popovici, Mihaela; Walke, Amey M.; Banerjee, Kaustuv; Ronchi, Nicolo; Meersschaut, Johan; Celano, Umberto; McMitchell, Sean; Spampinato, Valentina; Franquet, Alexis; Favia, Paola; Swerts, Johan; Van den Bosch, Geert; Van Houdt, Jan
Other Names:
Barabash Sergey V. guestEditor.; Fichtner Simon guestEditor.; Park Min Hyuk guestEditor.; Schenk Tony guestEditor.
Journal:
Physica status solidi
Issue:
Volume 15:Issue 5(2021)
Page Start:
n/a
Record Type:
Journal Article
View Content:
Available online (eLD content is only available in our Reading Rooms) ↗

3. Ferroelectric La‐Doped ZrO2/HfxZr1−xO2 Bilayer Stacks with Enhanced Endurance. Issue 5 (26th February 2021)

Authors:
Popovici, Mihaela; Walke, Amey M.; Banerjee, Kaustuv; Ronchi, Nicolo; Meersschaut, Johan; Celano, Umberto; McMitchell, Sean; Spampinato, Valentina; Franquet, Alexis; Favia, Paola; Swerts, Johan; Van den Bosch, Geert; Van Houdt, Jan
Journal:
Physica status solidi
Issue:
Volume 15:Issue 5(2021)
Page Start:
n/a
Record Type:
Journal Article
View Content:
Available online (eLD content is only available in our Reading Rooms) ↗

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