Author/Creator: Rodriguez, Ph. - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Author/Creator Rodriguez, Ph.

1. Advanced characterizations of fluorine-free tungsten film and its application as low resistance liner for PCRAM. (15th November 2017)

Authors:: Rodriguez, Ph.; Famulok, R.; Le Friec, Y.; Reynard, J.-Ph.; Bozon, B.-N.; Boyer, F.; Dabertrand, K.; Jahan, C.; Favier, S.; Mazel, Y.; Previtali, B.; Gergaud, P.; Nemouchi, F.
Journal:: Materials science in semiconductor processing
Issue:: Volume 71(2017)
Page Start:: 433
Record Type:: Journal Article
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2. Localized state exciton model investigation of B-content effect on optical properties of BGaAs/GaAs epilayers grown by MOCVD. (October 2016)

Authors:: Hidouri, T.; Saidi, F.; Maaref, H.; Rodriguez, Ph.; Auvray, L.
Journal:: Vacuum
Issue:: Volume 132(2016)
Page Start:: 10
Record Type:: Journal Article
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3. Localized state exciton model investigation of B-content effect on optical properties of BGaAs/GaAs epilayers grown by MOCVD. (October 2016)

Authors:: Hidouri, T.; Saidi, F.; Maaref, H.; Rodriguez, Ph.; Auvray, L.
Journal:: Vacuum
Issue:: Volume 132(2016)
Page Start:: 10
Record Type:: Journal Article
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4. Platinum redistribution in the Ni0.9Pt0.1/InP system: Impact on solid-state reaction and layer morphology. (15th June 2021)

Authors:: Boyer, F.; Dabertrand, K.; Gergaud, P.; Grégoire, M.; Rafhay, Q.; Rodriguez, Ph.
Journal:: Materials science in semiconductor processing
Issue:: Volume 128(2021)
Page Start:
Record Type:: Journal Article
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5. Study of the Ti/InGaAs solid-state reactions: Phase formation sequence and diffusion schemes. (July 2020)

Authors:: Bensalem, S.; Ghegin, E.; Boyer, F.; Lábár, J.L.; Menyhárd, M.; Gergaud, P.; Nemouchi, F.; Rodriguez, Ph.
Journal:: Materials science in semiconductor processing
Issue:: Volume 113(2020)
Page Start:
Record Type:: Journal Article
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6. Towards the understanding of the Ti/Al ratio role in solid-state reaction for ohmic contacts on n-GaN. (May 2023)

Authors:: Guillemin, S.; Messaoudene, S.; Gergaud, P.; Biscarrat, J.; Roulet, P.; Bernier, N.; Templier, R.; Souil, R.; Zucchi, X.; Rodriguez, Ph.
Journal:: Materials science in semiconductor processing
Issue:: Volume 158(2023)
Page Start:
Record Type:: Journal Article
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