1. Electrical characterization of stacked SOI nanowires at low temperatures. (May 2022) Authors: Rodrigues, Jaime C.; Mariniello, Genaro; Cassé, Mikael; Barraud, Sylvain; Vinet, Maud; Faynot, Olivier; Pavanello, Marcelo A. Journal: Solid-state electronics Issue: Volume 191(2022) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗