1. Electrical properties of inhomogeneous tungsten carbide Schottky barrier on 4H-SiC. (9th November 2020) Authors: Vivona, M; Greco, G; Bellocchi, G; Zumbo, L; Di Franco, S; Saggio, M; Rascunà, S; Roccaforte, F Journal: Journal of physics Issue: Volume 54:Number 5(2021) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Nanoscale structural and electrical properties of graphene grown on AlGaN by catalyst-free chemical vapor deposition. (9th October 2020) Authors: Giannazzo, F; Dagher, R; Schilirò, E; Panasci, S E; Greco, G; Nicotra, G; Roccaforte, F; Agnello, S; Brault, J; Cordier, Y; Michon, A Journal: Nanotechnology Issue: Volume 32:Number 1(2021) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Ni Schottky barrier on heavily doped phosphorous implanted 4H-SiC. (20th August 2021) Authors: Vivona, M; Greco, G; Spera, M; Fiorenza, P; Giannazzo, F; La Magna, A; Roccaforte, F Journal: Journal of physics Issue: Volume 54:Number 44(2021) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Thermal annealing effect on electrical and structural properties of Tungsten Carbide Schottky contacts on AlGaN/GaN heterostructures. (21st August 2020) Authors: Greco, G; Di Franco, S; Bongiorno, C; Grzanka, E; Leszczynski, M; Giannazzo, F; Roccaforte, F Journal: Semiconductor science and technology Issue: Volume 35:Number 10(2020) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Understanding the role of threading dislocations on 4H-SiC MOSFET breakdown under high temperature reverse bias stress. (8th January 2020) Authors: Fiorenza, P; Alessandrino, M S; Carbone, B; Di Martino, C; Russo, A; Saggio, M; Venuto, C; Zanetti, E; Giannazzo, F; Roccaforte, F Journal: Nanotechnology Issue: Volume 31:Number 12(2020) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗