1. Quantifying thermal transport in buried semiconductor nanostructures via cross-sectional scanning thermal microscopy. Issue 24 (11th June 2021) Authors: Spièce, Jean; Evangeli, Charalambos; Robson, Alexander J.; El Sachat, Alexandros; Haenel, Linda; Alonso, M. Isabel; Garriga, Miquel; Robinson, Benjamin J.; Oehme, Michael; Schulze, Jörg; Alzina, Francesc; Sotomayor Torres, Clivia; Kolosov, Oleg V. Journal: Nanoscale Issue: Volume 13:Issue 24(2021) Page Start: 10829 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗