1. Visualization and automatic detection of defect distribution in GaN atomic structure from sampling Moiré phase. (16th October 2017) Authors: Wang, Q H; Ri, S; Tsuda, H; Kodera, M; Suguro, K; Miyashita, N Journal: Nanotechnology Issue: Volume 28:Number 45(2017) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗