1. Strain Quantification Analysis of Epitaxial SiGe on SOI by Nanobeam Diffraction (NBD). (August 2014) Authors: Li, J.; Cheng, K.; Khakifirooz, A.; Wang, J.; Reznicek, A.; Madan, A.; Dons, B.; Loubet, N.; He, H.; Gaudiello, J. Journal: Microscopy and microanalysis Issue: Volume 20(2014)Supplement 3 Page Start: 1070 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Strain Quantification Analysis of Epitaxial SiGe on SOI by Nanobeam Diffraction (NBD). (August 2014) Authors: Li, J.; Cheng, K.; Khakifirooz, A.; Wang, J.; Reznicek, A.; Madan, A.; Dons, B.; Loubet, N.; He, H.; Gaudiello, J. Journal: Microscopy and microanalysis Issue: Volume 20:Number 3(2014:Jun.) Page Start: 1070 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗