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Author/Creator Renno, Axel D.

1. 'Box‐Profile' Ion Implants as Geochemical Reference Materials for Electron Probe Microanalysis and Secondary Ion Mass Spectrometry. Issue 4 (27th July 2019)

Authors:
Wu, Haosheng; Böttger, Roman; Couffignal, Frédéric; Gutzmer, Jens; Krause, Joachim; Munnik, Frans; Renno, Axel D.; Hübner, René; Wiedenbeck, Michael; Ziegenrücker, René
Journal:
Geostandards and geoanalytical research
Issue:
Volume 43:Issue 4(2019)
Page Start:
531
Record Type:
Journal Article
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Available online (eLD content is only available in our Reading Rooms) ↗

2. Enhancements in full‐field PIXE imaging—Large area elemental mapping with increased lateral resolution devoid of optics artefacts. (20th May 2018)

Authors:
Buchriegler, Josef; Klingner, Nico; Hanf, Daniel; Munnik, Frans; Nowak, Stanisław H.; Scharf, Oliver; Ziegenrücker, René; Renno, Axel D.; Borany, Johannes von
Journal:
X-ray spectrometry
Issue:
Volume 47:Number 4(2018)
Page Start:
327
Record Type:
Journal Article
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Available online (eLD content is only available in our Reading Rooms) ↗

4. Sub-pixel resolution with a color X-ray camera. Issue 9 (19th September 2015)

Authors:
Nowak, Stanisław H.; Bjeoumikhov, Aniouar; von Borany, Johannes; Buchriegler, Josef; Munnik, Frans; Petric, Marko; Radtke, Martin; Renno, Axel D.; Reinholz, Uwe; Scharf, Oliver; Wedell, Reiner
Journal:
Journal of analytical atomic spectrometry
Issue:
Volume 30:Issue 9(2015:Sep.)
Page Start:
1890
Record Type:
Journal Article
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Available online (eLD content is only available in our Reading Rooms) ↗