1. Accurate lifetime prediction for channel hot carrier stress on sub-1 nm equivalent oxide thickness HK/MG nMOSFET with thin titanium nitride capping layer. (July 2016) Authors: Luo, Weichun; Yang, Hong; Wang, Wenwu; Xu, Yefeng; Tang, Bo; Ren, Shangqing; Xu, Hao; Wang, Yanrong; Qi, Luwei; Yan, Jiang; Zhu, Huilong; Zhao, Chao; Chen, Dapeng; Ye, Tianchun Journal: Microelectronics and reliability Issue: Volume 62(2016) Page Start: 70 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Birt–Hogg–Dubé syndrome with rare unclassified renal cell carcinoma: A case report. Issue 51 (23rd December 2021) Authors: Ren, Shangqing; Luo, Cheng; Wang, Yaoqian; Wei, Yi; Ou, Yong; Yuan, Jiazheng; Li, Xinglan; Wang, Junyao; Lv, Qian; Yang, Bo; Fan, Shida; Zhou, Fang; Chen, Zhengjun; Nie, Yu; Wang, Dong Editors: Saranathan., Maya Journal: Medicine Issue: Volume 100:Issue 51(2021) Page Start: e28380 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Birt–Hogg–Dubé syndrome with rare unclassified renal cell carcinoma: A case report. Issue 51 (23rd December 2021) Authors: Ren, Shangqing; Luo, Cheng; Wang, Yaoqian; Wei, Yi; Ou, Yong; Yuan, Jiazheng; Li, Xinglan; Wang, Junyao; Lv, Qian; Yang, Bo; Fan, Shida; Zhou, Fang; Chen, Zhengjun; Nie, Yu; Wang, Dong Other Names: Saranathan. Maya section editor. Journal: Medicine Issue: Volume 100:Issue 51(2021) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Characterization of positive bias temperature instability of NMOSFET with high-k/metal gate last process. (1st January 2015) Authors: Ren, Shangqing; , YangHong; Tang, Bo; Xu, Hao; Luo, Weichun; Tang, Zhaoyun; Xu, Yefeng; Xu, Jing; Wang, Dahai; Li, Junfeng; Yan, Jiang; Zhao, Chao; Chen, Dapeng; Ye, Tianchun; Wang, Wenwu Journal: Journal of semiconductors Issue: Volume 36:Number 1(2015:Jan.) Page Start: 014007 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗