1. A Universal Method for Extracting and Quantitatively Analyzing Bias‐Dependent Contact Resistance in Carbon‐Nanotube Thin‐Film Transistors. (19th January 2023) Authors: Liu, Dexing; Wang, Wanting; Zhang, Jiaona; Ren, Qinqi; Fan, Lingchong; Wang, Yarong; Zhang, Yiming; Zhang, Min Journal: Advanced Electronic Materials Issue: Volume 9:Number 3(2023) Page Start: n/a Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Low-temperature supercritical activation enables high-performance detection of cell-free DNA by all-carbon-nanotube transistor. (30th August 2022) Authors: Ren, Qinqi; Zhang, Yaping; Ma, Shenhui; Wang, Xiaofang; Chang, Kuan-Chang; Zhang, Yiming; Yin, Feng; Li, Zigang; Zhang, Min Journal: Carbon Issue: Volume 196(2022) Page Start: 120 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Mixed‐Dimensional van der Waals Engineering for Charge Transfer Enables Wafer‐Level Flexible Electronics. (1st July 2022) Authors: Zhang, Yiming; Liu, Dexing; Huang, Qiuyue; Ren, Qinqi; Fan, Lingchong; Du, Chunhui; Zhang, Shengdong; Zhang, Min Journal: Advanced functional materials Issue: Volume 32:Number 36(2022) Page Start: n/a Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗