Author/Creator: Reisinger, M. - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Author/Creator Reisinger, M.

1. Cross-sectional stress distribution in AlxGa1-xN heterostructure on Si(111) substrate characterized by ion beam layer removal method and precession electron diffraction. (15th September 2016)

Authors:: Reisinger, M.; Zalesak, J.; Daniel, R.; Tomberger, M.; Weiss, J.K.; Darbal, A.D.; Petrenec, M.; Zechner, J.; Daumiller, I.; Ecker, W.; Sartory, B.; Keckes, J.
Journal:: Materials & design
Issue:: Volume 106(2016)
Page Start:: 476
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

2. Cross-sectional stress distribution in AlxGa1-xN heterostructure on Si(111) substrate characterized by ion beam layer removal method and precession electron diffraction. (15th September 2016)

Authors:: Reisinger, M.; Zalesak, J.; Daniel, R.; Tomberger, M.; Weiss, J.K.; Darbal, A.D.; Petrenec, M.; Zechner, J.; Daumiller, I.; Ecker, W.; Sartory, B.; Keckes, J.
Journal:: Materials & design
Issue:: Volume 106(2016)
Page Start:: 476
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

3. Matching in-situ and ex-situ recorded stress gradients in an AlxGa1 − xN Heterostructure: Complementary wafer curvature analyses in time and space. (1st April 2018)

Authors:: Reisinger, M.; Ostermaier, C.; Tomberger, M.; Zechner, J.; Sartory, B.; Ecker, W.; Daumiller, I.; Keckes, J.
Journal:: Scripta materialia
Issue:: Number 147(2018)
Page Start:: 50
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗