1. Effect of the switching layer on CBRAM reliability and benchmarking against OxRAM devices. (October 2021) Authors: Belmonte, A.; Reale, G.; Fantini, A.; Radhakrishnan, J.; Redolfi, A.; Devulder, W.; Nyns, L.; Kundu, S.; Delhougne, R.; Goux, L.; Kar, G.S. Journal: Solid-state electronics Issue: Volume 184(2021) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Impact of temperature and programming method on the data retention of Cu/Al2O3-based conductive-bridge RAM operated at low-current (10 μA). (November 2016) Authors: Belmonte, A.; Fantini, A.; Redolfi, A.; Houssa, M.; Jurczak, M.; Goux, L. Journal: Solid-state electronics Issue: Volume 125(2016) Page Start: 189 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Impact of temperature and programming method on the data retention of Cu/Al2O3-based conductive-bridge RAM operated at low-current (10 μA). (November 2016) Authors: Belmonte, A.; Fantini, A.; Redolfi, A.; Houssa, M.; Jurczak, M.; Goux, L. Journal: Solid-state electronics Issue: Volume 125(2016) Page Start: 189 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Stack optimization of oxide-based RRAM for fast write speed (<1 μs) at low operating current (<10 μA). (November 2016) Authors: Chen, C.Y.; Goux, L.; Fantini, A.; Degraeve, R.; Redolfi, A.; Groeseneken, G.; Jurczak, M. Journal: Solid-state electronics Issue: Volume 125(2016) Page Start: 198 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Stack optimization of oxide-based RRAM for fast write speed (<1 μs) at low operating current (<10 μA). (November 2016) Authors: Chen, C.Y.; Goux, L.; Fantini, A.; Degraeve, R.; Redolfi, A.; Groeseneken, G.; Jurczak, M. Journal: Solid-state electronics Issue: Volume 125(2016) Page Start: 198 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗