1. Energy filtered low voltage "in lens detector" SEM and XPS of natural fiber surfaces. Issue 9 (14th June 2013) Authors: Rasch, Ron; Stricher, Arthur; Truss, Rowan W. Journal: Journal of applied polymer science Issue: Volume 131:Issue 9(2014:May 05) Page Start: n/a Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. High Spatial Resolution X-Ray Analysis in a SEM. (11th March 2014) Authors: Chapman, Steve; Rasch, Ron Journal: Microscopy today Issue: Volume 22:Number 2(2014) Page Start: 24 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. High Spatial Resolution X-Ray Analysis in a SEM. (6th March 2014) Authors: Chapman, Steve; Rasch, Ron Journal: Microscopy today Issue: Volume 22:Number 2(2014) Page Start: 24 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. High Spatial Resolution X-Ray Analysis in a SEM. (6th March 2014) Authors: Chapman, Steve; Rasch, Ron Journal: Microscopy today Issue: Volume 22:Number 2(2014) Page Start: 24 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Quantitative surface analysis of hemp fibers using XPS, conventional and low voltage in‐lens SEM. Issue 8 (30th October 2015) Authors: Truss, Rowan W.; Wood, Barry; Rasch, Ron Journal: Journal of applied polymer science Issue: Volume 133:Issue 8(2016) Page Start: n/a Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗