1. Evaluation and application of a new scintillator‐based heat‐resistant back‐scattered electron detector during heat treatment in the scanning electron microscope. (17th December 2020) Authors: Podor, R.; Mendonça, J.; Lautru, J.; Brau, H. P.; Nogues, D.; Candeias, A.; Horodysky, P.; Kolouch, A.; Barreau, M.; Carrier, X.; Ramenatte, N.; Mathieu, S.; Vilasi, M. Journal: Journal of microscopy Issue: Volume 282:Part 1(2021) Page Start: 45 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗