1. Single-shot structural analysis by high-energy X-ray diffraction using an ultrashort all-optical source. Issue 1 (December 2017) Authors: Rakowski, R.; Golovin, G.; O'Neal, J.; Zhang, J.; Zhang, P.; Zhao, B.; Wilson, M.; Veale, M.; Seller, P.; Chen, S.; Banerjee, S.; Umstadter, D.; Fuchs, M. Journal: Scientific reports Issue: Volume 7:Issue 1(2017) Page Start: 1 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗