1. Density-Based Dynamically Self-Parameterized Clustering for Material Inspection. (20th October 2021) Authors: Radha, P; Selvakumar, N; Raja Sekar, J; Johnsonselva, J V Journal: Computer journal Issue: Volume 66:Number 2(2023) Page Start: 416 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗