Author/Creator: Rahimo, M. - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Author/Creator Rahimo, M.

1. Capacitive effects in IGBTs limiting their reliability under short circuit. (September 2017)

Authors:: Reigosa, P.D.; Iannuzzo, F.; Rahimo, M.; Blaabjerg, F.
Journal:: Microelectronics and reliability
Issue:: Volume 76/77(2017)
Page Start:: 485
Record Type:: Journal Article
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2. Comparison of thermal runaway limits under different test conditions based on a 4.5 kV IGBT. (September 2016)

Authors:: Reigosa, P.D.; Prindle, D.; Pâques, G.; Geissmann, S.; Iannuzzo, F.; Kopta, A.; Rahimo, M.
Journal:: Microelectronics and reliability
Issue:: Volume 64(2016)
Page Start:: 524
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

3. Comparison of thermal runaway limits under different test conditions based on a 4.5 kV IGBT. (September 2016)

Authors:: Reigosa, P.D.; Prindle, D.; Pâques, G.; Geissmann, S.; Iannuzzo, F.; Kopta, A.; Rahimo, M.
Journal:: Microelectronics and reliability
Issue:: Volume 64(2016)
Page Start:: 524
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

4. Extraction of dynamic avalanche during IGBT turn off. (September 2017)

Authors:: Geissmann, Silvan; Michielis, L. De; Corvasce, Ch.; Rahimo, M.; Andenna, M.
Journal:: Microelectronics and reliability
Issue:: Volume 76/77(2017)
Page Start:: 495
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗