Author/Creator: Råback, Peter - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Authors:: Kunwar, Anil; An, Lili; Liu, Jiahui; Shang, Shengyan; Råback, Peter; Ma, Haitao; Song, Xueguan
Journal:: Journal of materials science & technology
Issue:: Volume 50(2020)
Page Start:: 115
Record Type:: Journal Article
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Authors:: Todd, Joe; Christoffersen, Poul; Zwinger, Thomas; Råback, Peter; Chauché, Nolwenn; Benn, Doug; Luckman, Adrian; Ryan, Johnny; Toberg, Nick; Slater, Donald; Hubbard, Alun
Journal:: Journal of geophysical research
Issue:: Volume 123:Issue 3(2018)
Page Start:: 410
Record Type:: Journal Article
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Authors:: Kunwar, Anil; Shang, Shengyan; Råback, Peter; Wang, Yunpeng; Givernaud, Julien; Chen, Jun; Ma, Haitao; Song, Xueguan; Zhao, Ning
Journal:: Microelectronics and reliability
Issue:: Volume 80(2018)
Page Start:: 55
Record Type:: Journal Article
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Authors:: Vencels, Juris; Birjukovs, Mihails; Kataja, Juhani; Råback, Peter
Journal:: Case studies in thermal engineering
Issue:: Volume 15(2019)
Page Start:
Record Type:: Journal Article
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Authors:: Vuorinen, Ville; Aarnio, Mia; Alava, Mikko; Alopaeus, Ville; Atanasova, Nina; Auvinen, Mikko; Balasubramanian, Nallannan; Bordbar, Hadi; Erästö, Panu; Grande, Rafael; Hayward, Nick; Hellsten, Antti; Hostikka, Simo; Hokkanen, Jyrki; Kaario, Ossi; Karvinen, Aku; Kivistö, Ilkka; Korhonen, Marko; Kos...
Journal:: Safety science
Issue:: Volume 130(2020)
Page Start:
Record Type:: Journal Article
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Authors:: Takala, Eelis; Yurtesen, Evren; Westerholm, Jan; Ruokolainen, Juha; Råback, Peter
Journal:: Electromagnetics
Issue:: Volume 36:Issue 3(2016)
Page Start:: 167
Record Type:: Journal Article
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Authors:: Kunwar, Anil; Guo, Bingfeng; Shang, Shengyan; Råback, Peter; Wang, Yunpeng; Chen, Jun; Ma, Haitao; Song, Xueguan; Zhao, Ning
Journal:: Intermetallics
Issue:: Volume 93(2018:Feb.)
Page Start:: 186
Record Type:: Journal Article
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Authors:: Ma, Haoran; Kunwar, Anil; Chen, Jun; Qu, Lin; Wang, Yunpeng; Song, Xueguan; Råback, Peter; Ma, Haitao; Zhao, Ning
Journal:: Microelectronics and reliability
Issue:: Volume 83(2018)
Page Start:: 198
Record Type:: Journal Article
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