Author/Creator: Quevedo-Lopez, M.A. - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Author/Creator Quevedo-Lopez, M.A.

1. Cadmium(1−x)zinc(x)telluride thin films deposited by sequential pulsed laser deposition. (September 2015)

Authors:: Hernandez-Como, N.; Elizalde, J.; Mejia, I.; Quevedo-Lopez, M.A.
Journal:: Materials science in semiconductor processing
Issue:: Volume 37(2015:Sep.)
Page Start:: 93
Record Type:: Journal Article
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2. Effect of annealing temperature on the thermal transformation to cobalt oxide of thin films obtained via chemical solution deposition. (1st March 2020)

Authors:: Martínez-Gil, M.; Cabrera-German, D.; Pintor-Monroy, M.I.; García-Valenzuela, J.A.; Cota-Leal, M.; De la Cruz, W.; Quevedo-Lopez, M.A.; Pérez-Salas, R.; Sotelo-Lerma, M.
Journal:: Materials science in semiconductor processing
Issue:: Volume 107(2020)
Page Start:
Record Type:: Journal Article
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3. Modulation of the Pb/Sn ratio in Pb1-xSnxS thin films synthesized by chemical solution deposition. (December 2021)

Authors:: Fuentes-Ríos, J.L.; Cabrera-German, D.; Suárez-Campos, G.; Pintor-Monroy, M.I.; Hu, H.; Quevedo-Lopez, M.A.; Sotelo-Lerma, M.
Journal:: Materials science in semiconductor processing
Issue:: Volume 136(2021)
Page Start:
Record Type:: Journal Article
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4. PVP-SiO2 and PVP-TiO2 hybrid films for dielectric gate applications in CdS-based thin film transistors. (16th March 2020)

Authors:: de Urquijo-Ventura, M.S.; Rao, M.G. Syamala; Meraz-Davila, S.; Ochoa, J.A Torres-; Quevedo-Lopez, M.A.; Ramirez-Bon, R.
Journal:: Polymer
Issue:: Volume 191(2020)
Page Start:
Record Type:: Journal Article
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5. Temperature dependence of the electrical characteristics up to 370 K of amorphous In-Ga-ZnO thin film transistors. (January 2016)

Authors:: Estrada, M.; Rivas, M.; Garduño, I.; Avila-Herrera, F.; Cerdeira, A.; Pavanello, M.; Mejia, I.; Quevedo-Lopez, M.A.
Journal:: Microelectronics and reliability
Issue:: Volume 56(2016)
Page Start:: 29
Record Type:: Journal Article
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6. Temperature dependence of the electrical characteristics up to 370 K of amorphous In-Ga-ZnO thin film transistors. (January 2016)

Authors:: Estrada, M.; Rivas, M.; Garduño, I.; Avila-Herrera, F.; Cerdeira, A.; Pavanello, M.; Mejia, I.; Quevedo-Lopez, M.A.
Journal:: Microelectronics and reliability
Issue:: Volume 56(2016)
Page Start:: 29
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗