1. A 60 GOPS/W, −1.8 V to 0.9 V body bias ULP cluster in 28 nm UTBB FD-SOI technology. (March 2016) Authors: Rossi, Davide; Pullini, Antonio; Loi, Igor; Gautschi, Michael; Gürkaynak, Frank K.; Bartolini, Andrea; Flatresse, Philippe; Benini, Luca Journal: Solid-state electronics Issue: Volume 117(2016) Page Start: 170 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. A 60 GOPS/W, −1.8 V to 0.9 V body bias ULP cluster in 28 nm UTBB FD-SOI technology. (March 2016) Authors: Rossi, Davide; Pullini, Antonio; Loi, Igor; Gautschi, Michael; Gürkaynak, Frank K.; Bartolini, Andrea; Flatresse, Philippe; Benini, Luca Journal: Solid-state electronics Issue: Volume 117(2016) Page Start: 170 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗