Author/Creator: Puchner, Helmut - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Author/Creator Puchner, Helmut

1. Radiation induced soft errors in 16 nm floating gate SLC NAND flash memory. (May 2020)

Authors:: Chandrashekhar, Sandhya; Puchner, Helmut; Mitani, Jun; Shinozaki, Satoshi; Sardi, Mohamed; Hoffman, David
Journal:: Microelectronics and reliability
Issue:: Volume 108(2020)
Page Start:
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

2. Neutron-induced effects on a self-refresh DRAM. (January 2022)

Authors:: Matana Luza, Lucas; Söderström, Daniel; Puchner, Helmut; Alía, Rubén García; Letiche, Manon; Cazzaniga, Carlo; Bosio, Alberto; Dilillo, Luigi
Journal:: Microelectronics and reliability
Issue:: Volume 128(2022)
Page Start:
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗