1. Three-dimensional nanoscale characterisation of materials by atom probe tomography. (17th February 2018) Authors: Devaraj, Arun; Perea, Daniel E.; Liu, Jia; Gordon, Lyle M.; Prosa, Ty. J.; Parikh, Pritesh; Diercks, David R.; Meher, Subhashish; Kolli, R. Prakash; Meng, Ying Shirley; Thevuthasan, Suntharampillai Journal: International materials reviews Issue: Volume 63:Number 2(2018) Page Start: 68 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗