1. X-ray characterisation of the basal stacking fault densities of (112̄2) GaN. Issue 35 (9th August 2021) Authors: Pristovsek, Markus; Frentrup, Martin; Zhu, Tongtong; Kusch, Gunnar; Humphreys, Colin J. Journal: CrystEngComm Issue: Volume 23:Issue 35(2021) Page Start: 6059 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗