1. Glow discharge optical emission spectrometry for quantitative depth profiling of CIGS thin-films. Issue 6 (30th April 2019) Authors: Kodalle, Tim; Greiner, Dieter; Brackmann, Varvara; Prietzel, Karsten; Scheu, Anja; Bertram, Tobias; Reyes-Figueroa, Pablo; Unold, Thomas; Abou-Ras, Daniel; Schlatmann, Rutger; Kaufmann, Christian A.; Hoffmann, Volker Journal: Journal of analytical atomic spectrometry Issue: Volume 34:Issue 6(2019) Page Start: 1233 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Investigation of the potassium fluoride post deposition treatment on the CIGSe/CdS interface using hard X-ray photoemission spectroscopy – a comparative study. Issue 20 (10th May 2016) Authors: Ümsür, Bünyamin; Calvet, Wolfram; Steigert, Alexander; Lauermann, Iver; Gorgoi, Mihaela; Prietzel, Karsten; Greiner, Dieter; Kaufmann, Christian A.; Unold, Thomas; Lux-Steiner, Martha Ch. Journal: Physical chemistry chemical physics Issue: Volume 18:Issue 20(2016) Page Start: 14129 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗