1. Current tuned slotted Y‐branch laser for wafer thickness measurements with THz radiation. Issue 24 (12th September 2021) Authors: Surkamp, N.; Gerling, A.; O'Gorman, J.; Honsberg, M.; Schmidtmann, S.; Nandi, U.; Preu, S.; Sacher, J.; Brenner, C.; Hofmann, M. R. Journal: Electronics letters Issue: Volume 57:Issue 24(2021) Page Start: 936 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗