1. Exploration of neural network models for defect detection and classification. (2016) Authors: Praskash, B.V. Ajay; Ashoka, D.V.; Aradhya, V.N. Manjunath; Naveena, C. Journal: International journal of convergence computing Issue: Volume 2: Number 3/4(2016) Page Start: 220 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗