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You searched for: Author/Creator Postava, K.- Postava, K. [remove] 4
- 620.11 3
- Conference proceedings 3
- Materials science 3
- Materials science -- Congresses 3
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- Periodicals 3
- 620.505 1
- Depolarization -- Mueller matrix ellipsometry -- RCWA 1
- In-situ ellipsometry -- optical modeling -- thin films -- plasma-enhanced chemical vapor deposition -- microcrystalline silicon -- solar cells 1
- depth sensitivity -- magneto–optical ellipsometry -- material sensitivity -- magnetic nanostructures -- nanotechnology -- nanoparticles 1