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You searched for: Author/Creator Pollakowski, Beatrix- Pollakowski, Beatrix [remove] 3
- 530.41 2
- Solid state physics -- Periodicals 2
- Solids -- Industrial applications -- Periodicals 2
- 543.505 1
- Raman spectrometry -- X-ray spectrometry -- Raman mapping -- Calibration -- Traceability -- International System of Units -- SI -- Measurement uncertainty -- Cu(In -- Ga)Se2 -- Solar cell 1
- Spectrum analysis -- Periodicals 1
- grazing incidence X‐ray fluorescence -- In situ ellipsometry -- near edge X‐ray absorption fine structure -- protein adsorption -- spectroscopic ellipsometry 1
- grazing incidence X‐ray fluorescence -- material quality characterization -- micro‐structured silicon -- polycrystalline material -- thin‐film solar cells 1