1. Palladium contamination in silicon. (April 2015) Authors: Polignano, M.L.; Mica, I.; Ceresoli, M.; Codegoni, D.; Somaini, F.; Bianchi, I.; Volonghi, D. Journal: Solid-state electronics Issue: Volume 106(2015) Page Start: 68 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Point and extended defect interaction in low – high energy phosphorus implantation sequences. (2018) Authors: Mica, I.; Polignano, M.L.; Bacciaglia, P.; Brazzelli, D.; Cseh, D.; Galbiati, A.; Grasso, S.; Juhel, M.; Kiss, Z.T.; Monge Roffarello, P.; Tomezzoli, E.; Torti, A.M. Journal: Materials today Issue: Volume 5:Number 6(2018)Part 3 Page Start: 14778 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗