1. Atomic level termination for passivation and functionalisation of silicon surfaces. Issue 33 (13th August 2020) Authors: Grant, Nicholas E.; Pointon, Alex I.; Jefferies, Richard; Hiller, Daniel; Han, Yisong; Beanland, Richard; Walker, Marc; Murphy, John D. Journal: Nanoscale Issue: Volume 12:Issue 33(2020) Page Start: 17332 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Iodine–Ethanol Surface Passivation for Measurement of Millisecond Carrier Lifetimes in Silicon Wafers with Different Crystallographic Orientations. Issue 17 (16th July 2019) Authors: Al-Amin, Mohammad; Grant, Nicholas E.; Pointon, Alex I.; Murphy, John D. Other Names: Kissinger Gudrun guestEditor.; Kot Dawid guestEditor.; Richter Hans guestEditor.; Zöllner Marvin guestEditor. Journal: Physica status solidi Issue: Volume 216:Issue 17(2019) Page Start: n/a Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Minority carrier lifetime in indium doped silicon for photovoltaics. (6th August 2019) Authors: Murphy, John D.; Pointon, Alex I.; Grant, Nicholas E.; Shah, Vishal A.; Myronov, Maksym; Voronkov, Vladimir V.; Falster, Robert J. Journal: Progress in photovoltaics Issue: Volume 27:Number 10(2019) Page Start: 844 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗