1. Advances in Contactless Silicon Defect and Impurity Diagnostics Based on Lifetime Spectroscopy and Infrared Imaging. (31st May 2007) Authors: Schmidt, Jan; Pohl, Peter; Bothe, Karsten; Brendel, Rolf Other Names: Aberle Armin G. Academic Editor. Journal: Advances in optoelectronics Issue: Volume 2007(2007) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Advances in Contactless Silicon Defect and Impurity Diagnostics Based on Lifetime Spectroscopy and Infrared Imaging. (31st May 2007) Authors: Schmidt, Jan; Pohl, Peter; Bothe, Karsten; Brendel, Rolf Other Names: Aberle Armin G. Academic Editor. Journal: Advances in optoelectronics Issue: Volume 2007(2007) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗