1. Measurement of steep edges and undercuts in confocal microscopy. (May 2016) Authors: Mueller, T.; Jordan, M.; Schneider, T.; Poesch, A.; Reithmeier, E. Journal: Micron Issue: Volume 84(2016:May) Page Start: 79 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗