1. Atomic force microscopy with nanoelectrode tips for high resolution electrochemical, nanoadhesion and nanoelectrical imaging. (31st January 2017) Authors: Nellist, Michael R; Chen, Yikai; Mark, Andreas; Gödrich, Sebastian; Stelling, Christian; Jiang, Jingjing; Poddar, Rakesh; Li, Chunzeng; Kumar, Ravi; Papastavrou, Georg; Retsch, Markus; Brunschwig, Bruce S; Huang, Zhuangqun; Xiang, Chengxiang; Boettcher, Shannon W Journal: Nanotechnology Issue: Volume 28:Number 9(2017) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Nanoelectrical and Nanoelectrochemical Imaging of Pt/p‐Si and Pt/p+‐Si Electrodes. Issue 22 (7th August 2017) Authors: Jiang, Jingjing; Huang, Zhuangqun; Xiang, Chengxiang; Poddar, Rakesh; Lewerenz, Hans‐Joachim; Papadantonakis, Kimberly M.; Lewis, Nathan S.; Brunschwig, Bruce S. Journal: ChemSusChem Issue: Volume 10:Issue 22(2017) Page Start: 4657 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. PeakForce Scanning Electrochemical Microscopy with Nanoelectrode Probes. (26th October 2016) Authors: Huang, Zhuangqun; De Wolf, Peter; Poddar, Rakesh; Li, Chunzeng; Mark, Andreas; Nellist, Michael R.; Chen, Yikai; Jiang, Jingjing; Papastavrou, Georg; Boettcher, Shannon W.; Xiang, Chengxiang; Brunschwig, Bruce S. Journal: Microscopy today Issue: Volume 24:Number 6(2016) Page Start: 18 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗