1. A method for the tin pest presence testing in SnCu solder alloys. Issue 3 (27th May 2014) Authors: Skwarek, Agata; Kulawik, Jan; Czerwinski, Andrzej; Pluska, Mariusz; Witek, Krzysztof Journal: Soldering & surface mount technology Issue: Volume 26:Issue 3(2014) Page Start: 110 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. A method for the tin pest presence testing in SnCu solder alloys. Issue 3 (27th May 2014) Authors: Skwarek, Agata; Kulawik, Jan; Czerwinski, Andrzej; Pluska, Mariusz; Witek, Krzysztof Journal: Soldering & surface mount technology Issue: Volume 26:Issue 3(2014) Page Start: 110 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Changes in TCR of amorphous Ni–P resistive films as a function of thermal stabilization parameters. Issue 3 (29th July 2014) Authors: Kowalik, P.; Pruszowski, Z.; Kulawik, J.; Czerwiński, Andrzej; Pluska, Mariusz Editors: Agata Skwarek, Dr Journal: Microelectronics international Issue: Volume 31:Issue 3(2014) Page Start: 149 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Changes in TCR of amorphous Ni–P resistive films as a function of thermal stabilization parameters. Issue 3 (29th July 2014) Authors: Agata Skwarek, Dr; Kowalik, P.; Pruszowski, Z.; Kulawik, J.; Czerwiński, Andrzej; Pluska, Mariusz Journal: Microelectronics international Issue: Volume 31:Issue 3(2014) Page Start: 149 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Changes in TCR of amorphous Ni–P resistive films as a function of thermal stabilization parameters. Issue 3 (4th August 2014) Authors: Kowalik, P.; Pruszowski, Z.; Kulawik, J.; Czerwiński, Andrzej; Pluska, Mariusz Editors: Agata Skwarek, Dr Journal: Microelectronics international Issue: Volume 31:Issue 3(2014) Page Start: 149 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. Determining the Causes of Scanning Distortions in SEM and FIB. (23rd September 2015) Authors: Pluska, Mariusz; Czerwinski, Andrzej; Wzorek, Marek; Juchniewicz, Marcin; Katcki, Jerzy Journal: Microscopy and microanalysis Issue: Volume 21(2015:Jun.)Supplement 3 Page Start: 1703 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. Determining the Causes of Scanning Distortions in SEM and FIB. (August 2015) Authors: Pluska, Mariusz; Czerwinski, Andrzej; Wzorek, Marek; Juchniewicz, Marcin; Katcki, Jerzy Journal: Microscopy and microanalysis Issue: Volume 21(2015:Jun.)Supplement 3 Page Start: 1703 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
8. Formation of coupled-cavities in quantum cascade lasers using focused ion beam milling. Issue 9 (August 2015) Authors: Czerwinski, Andrzej; Pluska, Mariusz; Łaszcz, Adam; Ratajczak, Jacek; Pierściński, Kamil; Pierścińska, Dorota; Gutowski, Piotr; Karbownik, Piotr; Bugajski, Maciej Journal: Microelectronics and reliability Issue: Volume 55:Issue 9/10(2015) Page Start: 2142 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗