1. X‐ray reflectivity method for the characterization of InGaN/GaN quantum well interface. Issue 8 (6th January 2017) Authors: Massabuau, Fabien; Piot, Nicolas; Frentrup, Martin; Wang, Xiuze; Avenas, Quentin; Kappers, Menno; Humphreys, Colin; Oliver, Rachel Journal: Physica status solidi Issue: Volume 254:Issue 8(2017) Page Start: n/a Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗