Author/Creator: Pinaton, Jacques - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Author/Creator Pinaton, Jacques

1. A physics-informed Run-to-Run control framework for semiconductor manufacturing. (1st October 2020)

Authors:: Yang, Wei-Ting; Blue, Jakey; Roussy, Agnès; Pinaton, Jacques; Reis, Marco S.
Journal:: Expert systems with applications
Issue:: Volume 155(2020)
Page Start:
Record Type:: Journal Article
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2. Alarm Activations Analysis for Performance Enhancement in a Semiconductor Facility. Issue 6 (2022)

Authors:: Al-kharaz, Mohammed; Ananou, Bouchra; Ouladsine, Mustapha; Combal, Michel; Pinaton, Jacques
Journal:: IFAC-PapersOnLine
Issue:: Volume 55:Issue 6(2022)
Page Start:: 439
Record Type:: Journal Article
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3. Fault prognosis for batch production based on percentile measure and gamma process: Application to semiconductor manufacturing. (December 2016)

Authors:: Nguyen, T.B. Lien; Djeziri, Mohand; Ananou, Bouchra; Ouladsine, Mustapha; Pinaton, Jacques
Journal:: Journal of process control
Issue:: Volume 48(2016:Dec.)
Page Start:: 72
Record Type:: Journal Article
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4. Optimized allocation of defect inspection capacity with a dynamic sampling strategy. (January 2015)

Authors:: Rodriguez-Verjan, Gloria Luz; Dauzère-Pérès, Stéphane; Pinaton, Jacques
Journal:: Computers & operations research
Issue:: Volume 53(2015)
Page Start:: 319
Record Type:: Journal Article
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5. Regression Methods for Predicting the Product's Quality in the Semiconductor Manufacturing Process*. Issue 12 (2016)

Authors:: Melhem, Mariam; Ananou, Bouchra; Ouladsine, Mustapha; Pinaton, Jacques
Journal:: IFAC-PapersOnLine
Issue:: Volume 49:Issue 12(2016)
Page Start:: 83
Record Type:: Journal Article
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6. Remaining Useful Life estimation for noisy degradation trends. Issue 21 (2015)

Authors:: Nguyen, Thi-Bich-Lien; Djeziri, Mohand; Ananou, Bouchra; Ouladsine, Mustapha; Pinaton, Jacques
Journal:: IFAC-PapersOnLine
Issue:: Volume 48:Issue 21(2015)
Page Start:: 85
Record Type:: Journal Article
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7. Unsupervised Semiconductor chamber matching based on shape comparison. Issue 1 (July 2017)

Authors:: Marino, Julien; Rossi, Francesco; Ouladsine, Mustapha; Pinaton, Jacques
Journal:: IFAC-PapersOnLine
Issue:: Volume 50:Issue 1(2017)
Page Start:: 3905
Record Type:: Journal Article
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