1. Gamma and proton irradiation effects and thermal stability of electrical characteristics of metal-oxide-silicon capacitors with atomic layer deposited Al2O3 dielectric. (February 2016) Authors: Rafí, J.M.; Pellegrini, G.; Fadeyev, V.; Galloway, Z.; Sadrozinski, H.F.-W.; Christophersen, M.; Phlips, B.F.; Lynn, D.; Kierstead, J.; Hoeferkamp, M.; Gorelov, I.; Palni, P.; Wang, R.; Seidel, S. Journal: Solid-state electronics Issue: Volume 116(2016) Page Start: 38 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Gamma and proton irradiation effects and thermal stability of electrical characteristics of metal-oxide-silicon capacitors with atomic layer deposited Al2O3 dielectric. (February 2016) Authors: Rafí, J.M.; Pellegrini, G.; Fadeyev, V.; Galloway, Z.; Sadrozinski, H.F.-W.; Christophersen, M.; Phlips, B.F.; Lynn, D.; Kierstead, J.; Hoeferkamp, M.; Gorelov, I.; Palni, P.; Wang, R.; Seidel, S. Journal: Solid-state electronics Issue: Volume 116(2016) Page Start: 38 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗