1. Correlation between in situ structural and optical characterization of the semiconductor-to-metal phase transition of VO2 thin films on sapphire. Issue 2 (12th December 2019) Authors: Cesca, Tiziana; Scian, Carlo; Petronijevic, Emilija; Leahu, Grigore; Li Voti, Roberto; Cesarini, Gianmario; Macaluso, Roberto; Mosca, Mauro; Sibilia, Concita; Mattei, Giovanni Journal: Nanoscale Issue: Volume 12:Issue 2(2020) Page Start: 851 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗