1. Study of the physical properties of ZnS thin films deposited by RF sputtering. (15th November 2017) Authors: Le Donne, A.; Cavalcoli, D.; Mereu, R.A.; Perani, M.; Pagani, L.; Acciarri, M.; Binetti, S. Journal: Materials science in semiconductor processing Issue: Volume 71(2017) Page Start: 7 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗