1. Depth profiling analysis of HfON on SiON ultrathin films by parallel angle resolved x‐ray photoelectron spectroscopy and medium energy ion scattering. (22nd January 2016) Authors: Fauquier, Laurent; Pelissier, Bernard; Jalabert, Denis; Pierre, François; Doloy, Delphine; Beitia, Carlos; Baron, Thierry Other Names: Abel Marie‐Laure guestEditor.; Yubero Francesco guestEditor.; Watts John F. guestEditor. Journal: Surface and interface analysis Issue: Volume 48:Number 7(2016) Page Start: 436 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. HfO2/Al2O3/InGaAs MOSCAP Structures and InGaAs Plasma Nitridation Elaborated in a 300mm Pilot Line. (8th September 2015) Authors: Billaud, Mathilde; Duvernay, Julien; Grampeix, Helen; Pelissier, Bernard; Martin, Mickael; David, Sylvain; Vallée, Christophe; Chalupa, Zdenek; Boutry, Hervé; Baron, Thierry; Cassé, Mickaël; Ernst, Thomas; Vinet, Maud; Reimbold, Gilles; Faynot, Oliver Journal: ECS transactions Issue: Volume 69:Number 5(2015) Page Start: 9 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Mechanism of Spin‐Orbit Torques in Platinum Oxide Systems. (15th March 2022) Authors: Nath, Jayshankar; Trifu, Alexandru Vladimir; Gabor, Mihai Sebastian; Hallal, Ali; Auffret, Stephane; Labau, Sebastien; Mahjoub, Aymen; Chan, Edmond; Chaurasiya, Avinash Kumar; Mondal, Amrit Kumar; Yang, Haozhe; Schmoranzerova, Eva; Nsibi, Mohamed Ali; Joumard, Isabelle; Barman, Anjan; Pelissier, ... Journal: Advanced Electronic Materials Issue: Volume 8:Number 7(2022) Page Start: n/a Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗