1. Microstructure and Defect Characterization Using Advanced STEM Techniques: 4D-STEM and WB DF STEM. (August 2019) Authors: Miao, J.; Casalena, L.; Ciston, J.; Pekin, T.; Ghazisaeidi, M.; Mills, M. J. Journal: Microscopy and microanalysis Issue: Volume 25:(2022)Supplement 2 Page Start: 1834 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗