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Author/Creator Peisert, A.

1. Test beam demonstration of silicon microstrip modules with transverse momentum discrimination for the future CMS tracking detector. (6th March 2018)

Authors:
Adam, W.; Bergauer, T.; Brondolin, E.; Dragicevic, M.; Friedl, M.; Frühwirth, R.; Hoch, M.; Hrubec, J.; König, A.; Steininger, H.; Treberspurg, W.; Waltenberger, W.; Alderweireldt, S.; Beaumont, W.; Janssen, X.; Lauwers, J.; Mechelen, P. Van; Remortel, N. Van; Spilbeeck, A. Van; Beghin, D.
Journal:
Journal of instrumentation
Issue:
Volume 13:Number 3(2018:Mar.)
Page Start:
P03003
Record Type:
Journal Article
View Content:
Available online (eLD content is only available in our Reading Rooms) ↗

2. Test beam performance measurements for the Phase I upgrade of the CMS pixel detector. (30th May 2017)

Authors:
Dragicevic, M.; Friedl, M.; Hrubec, J.; Steininger, H.; Gädda, A.; Härkönen, J.; Lampén, T.; Luukka, P.; Peltola, T.; Tuominen, E.; Tuovinen, E.; Winkler, A.; Eerola, P.; Tuuva, T.; Baulieu, G.; Boudoul, G.; Caponetto, L.; Combaret, C.; Contardo, D.; Dupasquier, T.
Journal:
Journal of instrumentation
Issue:
Volume 12:Number 5(2017:May)
Page Start:
P05022
Record Type:
Journal Article
View Content:
Available online (eLD content is only available in our Reading Rooms) ↗

3. The CMS Phase-1 pixel detector upgrade. (1st February 2021)

Authors:
Adam, W.; Bergauer, T.; Blöch, D.; Dragicevic, M.; Frühwirth, R.; Hinger, V.; Steininger, H.; Beaumont, W.; Croce, D. Di; Janssen, X.; Lauwers, J.; Mechelen, P. Van; Remortel, N. Van; Blekman, F.; Chhibra, S.S.; Clercq, J. De; D'Hondt, J.; Lowette, S.; Moortgat, S.; Morton, A.
Journal:
Journal of instrumentation
Issue:
Volume 16:Number 2(2021)
Page Start:
P02027
Record Type:
Journal Article
View Content:
Available online (eLD content is only available in our Reading Rooms) ↗

4. Trapping in proton irradiated p+-n-n+ silicon sensors at fluences anticipated at the HL-LHC outer tracker. (22nd April 2016)

Authors:
Adam, W.; Bergauer, T.; Dragicevic, M.; Friedl, M.; Fruehwirth, R.; Hoch, M.; Hrubec, J.; Krammer, M.; Treberspurg, W.; Waltenberger, W.; Alderweireldt, S.; Beaumont, W.; Janssen, X.; Luyckx, S.; Mechelen, P. Van; Remortel, N. Van; Spilbeeck, A. Van; Barria, P.; Caillol, C.; Clerbaux, B.
Journal:
Journal of instrumentation
Issue:
Volume 11:Number 4(2016:Apr.)
Page Start:
P04023
Record Type:
Journal Article
View Content:
Available online (eLD content is only available in our Reading Rooms) ↗