1. Improved Data Analysis with IVAS 4 and AP Suite. (August 2019) Authors: Reinhard, D.A.; Payne, T.R.; Strennen, E.M.; Oltman, E.; Geiser, B.P.; Sobering, G.S.; Mandt, J. Journal: Microscopy and microanalysis Issue: Volume 25:(2022)Supplement 2 Page Start: 302 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Atom Probe Tomography Productivity Enhancements. (August 2019) Authors: Reinhard, D.A.; Payne, T.R.; Strennen, E.M.; Oltman, E.; Geiser, B.P.; Sobering, G.S.; Lenz, D.R.; Mandt, J.; Groth, G.A.; Larson, D.J.; Ulfig, R.M.; Prosa, T.J. Journal: Microscopy and microanalysis Issue: Volume 25:(2022)Supplement 2 Page Start: 522 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Data Quality Improvements in the Voltage-Pulsed LEAP 5000 R/XR. (August 2015) Authors: Ulfig, R.M.; Prosa, T.J.; Lenz, D.R; Payne, T.R. Journal: Microscopy and microanalysis Issue: Volume 21(2015:Jun.)Supplement 3 Page Start: 41 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗