Author/Creator: Paulasto-Kröckel, M. - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Author/Creator Paulasto-Kröckel, M.

1. A humidity-induced novel failure mechanism in power semiconductor diodes. (August 2021)

Authors:: Leppänen, J.; Ross, G.; Vuorinen, V.; Ingman, J.; Jormanainen, J.; Paulasto-Kröckel, M.
Journal:: Microelectronics and reliability
Issue:: Volume 123(2021)
Page Start:
Record Type:: Journal Article
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2. Force measurements during posterior calvarial vault osteodistraction: A novel measurement method. Issue 6 (June 2017)

Authors:: Ritvanen, A.; Savolainen, M.; Nowinski, D.; Saiepour, D.; Paulasto-Kröckel, M.; Hukki, J.; Tukiainen, E.; Leikola, J.
Journal:: Journal of cranio-maxillofacial surgery
Issue:: Volume 45:Issue 6(2017)
Page Start:: 981
Record Type:: Journal Article
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3. Optimization of contact metallizations for reliable wafer level AuSn bonds. (September 2016)

Authors:: Vuorinen, V.; Rautiainen, A.; Heikkinen, H.; Paulasto-Kröckel, M.
Journal:: Microelectronics and reliability
Issue:: Volume 64(2016)
Page Start:: 676
Record Type:: Journal Article
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4. Optimization of contact metallizations for reliable wafer level AuSn bonds. (September 2016)

Authors:: Vuorinen, V.; Rautiainen, A.; Heikkinen, H.; Paulasto-Kröckel, M.
Journal:: Microelectronics and reliability
Issue:: Volume 64(2016)
Page Start:: 676
Record Type:: Journal Article
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5. XRD and ToF-SIMS study of intermetallic void formation in Cu-Sn micro-connects. (September 2017)

Authors:: Ross, G.; Vuorinen, V.; Krause, M.; Reissaus, S.; Petzold, M.; Paulasto-Kröckel, M.
Journal:: Microelectronics and reliability
Issue:: Volume 76/77(2017)
Page Start:: 390
Record Type:: Journal Article
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