1. High-Resolution Phase-Contrast Imaging at XFELs. (23rd September 2015) Authors: Schropp, A.; Hoppe, R.; Meier, V.; Patommel, J.; Seiboth, F.; Lee, Hae Ja; Nagler, B.; Galti er, E.C; Arnol d, B.; Hastings, J.B.; chroer, C.G.S Journal: Microscopy and microanalysis Issue: Volume 21(2015:Jun.)Supplement 3 Page Start: 2167 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. High-Resolution Phase-Contrast Imaging at XFELs. (August 2015) Authors: Schropp, A.; Hoppe, R.; Meier, V.; Patommel, J.; Seiboth, F.; Lee, Hae Ja; Nagler, B.; Galti er, E.C; Arnol d, B.; Hastings, J.B.; chroer, C.G.S Journal: Microscopy and microanalysis Issue: Volume 21(2015:Jun.)Supplement 3 Page Start: 2167 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗