1. Atomic Scale Analysis of Terrestrial and Extra-Terrestrial Geomaterials Using Atom Probe Tomography. (23rd September 2015) Authors: Gorman, Brian P.; Diercks, David R.; Parman, Stephen; Cooper, Reid Journal: Microscopy and microanalysis Issue: Volume 21(2015:Jun.)Supplement 3 Page Start: 1311 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Atomic Scale Analysis of Terrestrial and Extra-Terrestrial Geomaterials Using Atom Probe Tomography. (August 2015) Authors: Gorman, Brian P.; Diercks, David R.; Parman, Stephen; Cooper, Reid Journal: Microscopy and microanalysis Issue: Volume 21(2015:Jun.)Supplement 3 Page Start: 1311 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗