Author/Creator: Park, Se-Hoon - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Author/Creator Park, Se-Hoon

1. Degradation of adhesion between Cu and epoxy-based dielectric during exposure to hot humid environments. (November 2017)

Authors:: Ahn, Key-one; Park, Se-Hoon; Kim, Young-Ho
Journal:: Microelectronics and reliability
Issue:: Volume 78(2017)
Page Start:: 1
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

2. Drop-shock reliability improvement of embedded chip resistor packages through via structure modification. (August 2016)

Authors:: Park, Se-Hoon; Park, Jong Chul; Park, Jae-Yong; Kim, Young-Ho
Journal:: Microelectronics and reliability
Issue:: Volume 63(2016)
Page Start:: 194
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

3. Drop-shock reliability improvement of embedded chip resistor packages through via structure modification. (August 2016)

Authors:: Park, Se-Hoon; Park, Jong Chul; Park, Jae-Yong; Kim, Young-Ho
Journal:: Microelectronics and reliability
Issue:: Volume 63(2016)
Page Start:: 194
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗