1. A high-precision current measurement platform applied for statistical measurement of discharge current transient spectroscopy of traps in SiN dielectrics. (27th July 2021) Authors: Saito, Koga; Suzuki, Hayato; Park, Hyeonwoo; Kuroda, Rihito; Teramoto, Akinobu; Suwa, Tomoyuki; Sugawa, Shigetoshi Journal: Japanese journal of applied physics Issue: Volume 60:Number 8(2021) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Effect of drain current on appearance probability and amplitude of random telegraph noise in low-noise CMOS image sensors. (14th March 2018) Authors: Ichino, Shinya; Mawaki, Takezo; Teramoto, Akinobu; Kuroda, Rihito; Park, Hyeonwoo; Wakashima, Shunichi; Goto, Tetsuya; Suwa, Tomoyuki; Sugawa, Shigetoshi Journal: Japanese journal of applied physics Issue: Volume 57:Number 4(2018)Supplement Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Experimental investigation of localized stress-induced leakage current distribution in gate dielectrics using array test circuit. (13th March 2018) Authors: Park, Hyeonwoo; Teramoto, Akinobu; Kuroda, Rihito; Suwa, Tomoyuki; Sugawa, Shigetoshi Journal: Japanese journal of applied physics Issue: Volume 57:Number 4(2018)Supplement Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Impact of CoFeB surface roughness on reliability of MgO films in CoFeB/MgO/CoFeB magnetic tunnel junction. (18th July 2019) Authors: Park, Hyeonwoo; Teramoto, Akinobu; Tsuchimoto, Jun-Ichi; Hayashi, Marie; Hashimoto, Keiichi; Sugawa, Shigetoshi Journal: Japanese journal of applied physics Issue: Volume 58:Number SI(2019) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗